The Thin Films and Nanomaterials Program

The Dauskardt research group has a range of programs studying adhesion and thermomechanical reliability in complex thin-film systems employed in emerging nanoscience technologies.  Films are often structured at nanometer length scales.  The research enables innovation and design of new materials and interfaces for emerging technologies and is crucial for thermomechanical reliability modeling. 

Current Research (in no particular order) Students
Interface Strength and Characterization in Ultra-Thin Film Structures Ryan Birringer
Adhesion Properties of Transparent Hard Coatings on Plastics Ani Kamer
Metal/Epoxysilane Sol-Gel Coupling Layers Mark Oliver
Molecular Reinforcing Strategies Max Gage
Post-Deposition Curing
> Depth Dependence of UV Curing
Max Gage
Taek-Soo Kim
Adhesion of Ultrathin Nanoporous Polymer Layers Andrew Kearney
Novel Micro-Mechanical Testing Andrew Kearney
Alex Hsing
Stress and Solution Chemistry Effects for Optimized CMP of Ultra-Low-k Dielectrics Taek-Soo Kim
Aqueous Solution Diffusion in Nanoporous Thin Films Taek-Soo Kim
Control of Delamination in Thin Film Stacks: Novel Enabling Technologies for Three-Dimensional Structures Markus Ong
Debonding Under Fatigue Loading at Polymer/Inorganic Interfaces Bree Sharratt
Mechanics and Fracture of Patterned Device Structures Mary Ann Shuller
Reliability of Microelectronic Devices Michael Lane
Packaging Reliability Seung-Yeop Kook
Polymer Interface Adhesion Jeffrey Snodgrass
Solder Ball Attach Reliability Lorraine Wang
Adhesion of Silica-filled Epoxy Underfill Lorraine Wang
Die Attach Reliability Robert Hohlfelder
Dan Maidenberg

 


Department of Materials Science and Engineering, Stanford University

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